Volumetric segmentation using weibull E-SD fields
Jiuxiang Hu, A. Razdan, Gregory M. Nielson, Gerald E. Farin, D. Page Baluch, David G. Capco · IEEE Transactions on Visualization and Computer Graphics · 2003
This paper presents a coarse-grain approach for segmentation of objects with gray levels appearing in volume data. The input data is on a 3D structured grid of vertices v(i. j. k), each associated with a scalar value. In this paper, we consider a voxel as a /spl kappa/ /spl times/ /spl kappa/ /spl times/ /spl kappa/ cube and each voxel is assigned two values: expectancy and standard deviation (E-SD). We use the Weibull noise index to estimate the noise in a voxel and to obtain more precise E-SD values for each voxel. We plot the frequency of voxels which have the same E-SD, then 3D segmentation based on the Weibull E-SD field is presented. Our test bed includes synthetic data as well as real volume data from a confocal laser scanning microscope (CLSM). Analysis of these data all show distinct and defining regions in their E-SD fields. Under the guide of the E-SD field, we can efficiently segment the objects embedded in real and simulated 3D data.