Test generation for crosstalk-induced delay in integrated circuits
Wei-Yu Chen, Sandeep K. Gupta, M.A. Breuer · 2003
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper shows how crosstalk coupling between lines can affect the propagation delay of signals in integrated circuits. A model is presented to evaluate the effect of parasitic coupling crosstalk. Conditions for the creation of the worst-case coupling and propagation of a delayed signal are presented. A test pattern generation algorithm utilizing the above conditions is presented and applied to several example circuits.