Multi-gigahertz testing challenges and solutions
Karim Arabi, Klaus D. Hilliges, David C. Keezer, Sassan Tabatabaei · 2005
The advent of terabit aggregate rate telecommunication devices and multi-gigahertz I/O interfaces is posing new challenges on the semiconductor and ATE industries. Telecom chipmakers are currently using ad hoc techniques to test these kinds of devices due to the lack of a credible commercial solution. This session highlights the challenges of testing multi-gigahertz interfaces and presents promising early solutions.