On test generation for transition faults with minimized peak power dissipation
Wei Li, Sudhakar M. Reddy, Irith Pomeranz · 2004
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests for stuck-at faults. The proposed method is suitable for use in testing scan designs that employ enhanced scan. The method reduces the peak power consumption in benchmark circuits by 19% on the average with essentially the same test set size and the same fault coverage compared to an earlier method.