Analysis of I/sub DDQ/ detectable bridges in combinational CMOS circuits
Eugeni Isern, Joan Figueras · 2002
Functionally equivalent nodes may cause some bridging faults to become undetectable by I/sub DDQ/ testing. An efficient method for the identification of classes of functionally equivalent nodes in combinational circuits, based on OBDD comparison, is presented. To illustrate the methodology, the I/sub DDQ/ undetectable logic bridging faults have been identified in a set of benchmark circuits.>