A technique of optimal built-in self-test circuitries generation
Natalia V. Chebykina, Sergey G. Mosin · 2010
The technique of generating an optimal built-in self-test (BIST) circuitries has been proposed. The technique is oriented on minimization of hardware overheads and dealt with automatization of BIST circuitries generation. The main idea consists in the use one test generator based on linear feedback shift register (LFSR) in two types of testing - pseudorandom and deterministic. The technique has been realized as CAD subsystems. The experimental results of technique application for some ISCAS'89 benchmark circuits have been shown.