A new testing method for EEPLA
Rochit Rajsuman · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994
A testing method for EEPLA's is presented. The method requires small amount of extra hardware and provides complete fault coverage. This method exploits the fact that each crosspoint can be reprogrammed in EEPLA. To our knowledge, this is the first algorithmic test method applicable to EEPLA's. In the proposed approach, all single and multiple crosspoint faults, stuck-at faults, and bridging faults are detectable. The test set is simple and is easy to derive.>