A Complex Electronics System Built-in-Test Based on Time-Triggered CAN Bus
Zhiying Wang, Weidong Ma, Xiong Guangze · 2007
This paper describes the built-in-test design and analysis of the X-by-wire system named complex electronics system (CES). The components of CES communicate with each other based on the CAN bus with time-triggered schedule, to support deterministic and safety-critical applications. The behavior of all nodes are based on global schedule, global clock synchronization, and mixed of event-triggered with special window in the system matrix period. The test ECU module is designed with ARM9 processor, can support a powerful testing function sets. The experiment and simulation expressed that the built-in-test schema with mixed schedule of CAN bus is a good method to solve the deterministic behavior and guarantee some basic quality of service, even in presence of faults.