Advances in Quantum Computing Fault Tolerance and Testing

David Y. Feinstein, Vivek Nair, Mitchell Aaron Thornton · 2007

We study developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustrate the inherent need for fault tolerance in QC due to the decoherence problem. Further, we examine several ideas regarding random testing and examine the viability of built-in-system-test (BIST) in future QC circuits.

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