Dynamic testing of Xilinx Virtex-II field programmable gate array (FPGA) input/output blocks (IOBs)
Gary M. Swift, Sana Rezgui, Jeffrey S. George, Carl Carmichael, Mary A. Napier, John Maksymowicz, Jason Moore, Austin Lesea, R. Koga, Theodore F. Wrobel · IEEE Transactions on Nuclear Science · 2004
Heavy-ion irradiation and fault injection experiments were conducted to evaluate the upset sensitivity of the Xilinx Virtex-II field programmable gate arrays (FPGAs) input/output block (IOB). Full triple module redundancy (TMR) of the IOBs, in combination with regular configuration scrubbing, proved to be a quite effective upset mitigation method.