Built-in self-test for multiple CLB faults of a LUT type FPGA
Noriyoshi Itazaki, Fumirou Matsuki, Yohei Matsumoto, K. Kinoshita · 2002
A new Built-in Self Test (BIST) method for multiple configurable logic block (CLB) faults of SRAM-Look-Up-Table (LUT) type FPGA is reported. In this method, self test is performed concurrently for every test block containing eight CLBs. Faulty FPGA which includes up to five faulty CLBs in one test block can be detected completely even if each faulted CLB includes unlimited number of faults.