Signal generators for cost effective BIST of ADCs
Bharath Karthik Vasan, Jingbo Duan, Chen Zhao, R.L. Geiger, Degang J. Chen · 2009
Conventional approach to linearity testing of ADCs requires a signal generator that is more linear than the device under test (DUT). Recently introduced ADC testing algorithms dramatically relax the linearity requirements on the signal generator in exchange for maintaining a known functional relationship between two unknown nonlinear test signals. Simple signal generators that can be used to generate the two non-linear signals are discussed. Simulation results show that the generated signals can be used to test ADCs with resolution ranging between 6 and 17 bits.