Incremental Model-based Test Suite Reduction with Formal Concept Analysis
Pin Ng, Richard Y.K. Fung, Ray W.M. Kong · Journal of Information Processing Systems · 2010
Test scenarios can be derived based on some system models for requirements validation purposes. Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios and a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to determine incrementally a minimal set of test scenarios with adequate test coverage.