BIST using pseudorandom test vectors and signature analysis
F. Wang · 2003
A tutorial is provided on a popular built-in self-test (BIST) scheme that uses pseudorandomly generated vectors as test stimuli and the signature-analysis technique to verify test results. The guidelines presented permit IC designers to implement the BIST method in their circuits using various design considerations and tradeoffs to achieve hardware efficiency and improved levels of controllability, observability, and testability.>