X-Press Compactor for 1000x Reduction of Test Data
Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab · 2006
The paper presents a two-stage test response compactor with an overdrive section and scan chain selection logic. The proposed solution is capable of handling a wide range of X state profiles, offers compaction much higher than the ratio of scan chains to compactor outputs, and provides excellent diagnostic resolution