Built in Self-Test for 4 × 4 Signed and Unsigned Multipliers in FPGA
Shrikant Vaishnav, Puran Gaur, Braj Bihari Soni · International Journal of Computer Applications · 2014
ASTRACTBuilt in self-test (BIST) is a technique or a method which allow the circuit to test itself.BIST increases the controllability and observability of integrated circuit therefore it is easier to apply inputs and then detect faults from it [11].BIST also decreases the time of testing integrated circuits & gives very high fault coverage.Therefore in many ways BIST help us in detecting fault in integrated circuits.This paper presents an efficient fault detection algorithm for 4 × 4 signed & unsigned multiplier in field programmable gate array (FPGA).These techniques were successfully applied on booth, braun & unsigned array multipliers.