Explicit elimination of easy-to-test faults in a sequential test generator
Tsu-Wei Ku, Wei‐Kong Chia · 2002
The authors describe how to eliminate easy-to-test faults after each sequential test vector is generated. The elimination process is conducted using a combinational test generator. Two new classes of faults called 0-step and 1-step testable faults are defined. The percentages of such faults are determined for MCNC benchmark circuits. The CPU time can be up to 150% faster than STEED (a Berkley sequential test generator) and the number of test vectors can be 38% less.>