Multiple redundancy removal during test generation and synthesis
D.M. Wu, R.M. Swanson · 2003
Techniques of multiple redundancy removal (MRFE) during test generation are described in this paper. A redundant fault, once identified, is propagated forward and backward through the sensitized paths to identify other redundant faults in the circuit under test. The technique is also applied to the class of 'dropped faults' and 'untested faults'. This technique can also be applied to logic minimization during synthesis.>