Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs
Alejandro Cook, Dominik Ull, Melanie Elm, Hans-Joachim Wunderlich, Helmut Randoll, Stefan Dohren · 2012
The automotive industry has to deal with an increasing amount of electronics in today's vehicles. This paper describes the advantages of structural tests during in-field system test, reusing existing test data and on-chip structures. Demonstration is the embedded test of an ASIC within an automotive control unit, utilizing manufacturing scan-tests.