Analyzing and diagnosing interconnect faults in bus-structured systems
Jun Zhao, F.J. Meyer, Fabrizio Aghini Lombardi · IEEE Design & Test of Computers · 2002
Testing multimodule systems presents several challenges, particularly when systems use submicron technology. The authors propose strategies to diagnose interconnect faults in bus-structured systems using several models. We propose several methods and strategies for a diagnosis using different fault models, including those applicable to submicron technology. Besides defining new features, such as the logical extent of faults, we also propose a reduction strategy that permits 100% fault detection and identification (including fault location).