Fault diagnosis in non‐reciprocal networks
E.I. Plotkin, Leonid M. Roytman, M.N.S. Swamy · International Journal of Circuit Theory and Applications · 1982
Abstract Based on the theorem concerning the maximum number of independent simulations in an m‐port together with Tellegen's theorem, some methods are proposed for the determination of the values of the faulty elements. These methods require a minimum number of measurements at the external nodes of the circuit. A numerical example of the application of such a method is given.