New hierarchical approach to pattern matching for industrial applications
Markus Brandner, Axel J. Pinz, Wolfgang Poelzleitner · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000
In this paper a new hierarchical structure for fast, robust geometry-based pattern matching is proposed. As opposed to many pattern matching systems reported in the literature we use a structure comprising a number of alternating feature processing and constraint layers. Feature extraction accuracy ranges from coarse at the bottom of the structure to a fine level at the top. A 2D quasi-affine matching system based on the proposed structure has been implemented. Experiments show the reduction in the amount of image data being processed in every layer of the structure as a consequence of applying constraints to the data between two adjacent feature extraction layers. The structure is able to utilize scalable feature extraction algorithms as well as the incorporation of a priori knowledge into the feature extraction.