Feature Extraction Using Supervised Independent Component Analysis by Maximizing Class Distance
Yoshinori Sakaguchi, Seiichi Ozawa, Manabu Kotani · IEEJ Transactions on Electronics Information and Systems · 2004
Recently, Independent Component Analysis (ICA) has been applied to not only problems of blind signal separation, but also feature extraction of patterns. However, the effectiveness of pattern features extracted by conventional ICA algorithms depends on pattern sets; that is, how patterns are distributed in the feature space. As one of the reasons, we have pointed out that ICA features are obtained by increasing only their independence even if the class information is available. In this context, we can expect that more high-performance features can be obtained by introducing the class information into conventional ICA algorithms.In this paper, we propose a supervised ICA (SICA) that maximizes Mahalanobis distance between features of different classes as well as maximize their independence. In the first experiment, two-dimensional artificial data are applied to the proposed SICA algorithm to see how maximizing Mahalanobis distance works well in the feature extraction. As a result, we demonstrate that the proposed SICA algorithm gives good features with high separability as compared with principal component analysis and a conventional ICA. In the second experiment, the recognition performance of features extracted by the proposed SICA is evaluated using the three data sets of UCI Machine Learning Repository. From the results, we show that the better recognition accuracy is obtained using our proposed SICA. Furthermore, we show that pattern features extracted by SICA are better than those extracted by only maximizing the Mahalanobis distance.