Embedded Test Features for High-Speed Serial I/O
Jeff Rearick · 2007
High-speed serial I/O interfaces are becoming ubiquitous, yet remain very challenging to test effectively and efficiently (or even at all) during high volume production. The use of on-chip test and measurement circuitry to assist or replace external equipment is an emerging paradigm to address the issue. A brief survey of these embedded test features and their optimization for HVM support, plus an overview of the activity of the IEEE P1687 working group, is presented.