Uncertainty in ellipse fitting using a flatbed scanner: development and experimental verification
J de Vicente, Ana María Sánchez Pérez, Miguel Berzal, Piera Maresca, Emilio Gómez · Measurement Science and Technology · 2013
In the field of dimensional metrology, the use of optical measuring machines requires the handling of a large number of measurement points, or scanning points, taken from the image of the measurand. The presence of correlation between these measurement points has a significant influence on the uncertainty of the result. The aim of this work is the development of an estimation procedure for the uncertainty of measurement in a geometrically elliptical shape, taking into account the correlation between the scanning points. These points are obtained from an image produced using a commercial flat bed scanner. The characteristic parameters of the ellipse (coordinates of the center, semi-axes and the angle of the semi-major axis with regard to the horizontal) are determined using a least squares fit and orthogonal distance regression. The uncertainty is estimated using the information from the auto-correlation function of the residuals and is propagated through the fitting algorithm according to the rules described in Evaluation of Measurement Data—Supplement 2 to the ' Guide to the Expression of Uncertainty in Measurement ' —Extension to any number of output quantities . By introducing the concept of cut-off length, it can be observed how it is possible to take into account the presence of the correlation in the estimation of uncertainty in a very simple way while avoiding underestimation.