Analytical data modeling for equivalence proofing and anchoring simulations with measured data
Holger M. Jaenisch, James W. Handley, Michael L. Hicklen · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2006
This paper presents a novel analytical method for comparing simulation data with measured data, with the goal of proving Equivalence and Consistency between the model and the real data. Our method overcomes the problems of disparity in the inputs to the simulation and varying number of parameters between the simulation and the measured flight data. Our method derives analytical Data Models that are analyzed in frequency space, yielding quantitative assessment values for the model performance relative to the measured data. The model output for a sensor and its "real world" measured data are collected for comparison.