On built-in test reuse in object-oriented framework design
Yingxu Wang, Dilip A. Patel, Graham A. King, Ian Court, Geoff Staples, Maraget Ross, Mohamad F. Fayad · ACM Computing Surveys · 2000
ABSTRACT: Object-oriented frameworks have extended reusability of software from code modules to architectural and domain information. This paper further extends software reusability from code and architecture to built-in tests (BITs) in object-oriented framework development. Methods for embedding BITs at object and object-oriented framework levels are addressed. Behaviours of objects and object-oriented frameworks with BITs in the normal and test modes are analyzed. Systematic reuse methods of BITs in object-oriented framework development are provided. The most interesting development in the paper is that the BITs in object-oriented frameworks can be inherited and reused as that of code. Therefore testability and maintainability of the test-built-in object-oriented frameworks can be improved by the BIT approach. The BIT method can be used in analysis, design and coding of object-oriented frameworks.