Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits
Chi-Chang Liaw, Su, Malaiya · IEEE Transactions on Computers · 1981
Practical solutions have not been obtained from the previous papers addressing the problem of testing intermittent faults in sequential circuits. Existing methods are only suitable for small sequential circuits. This correspondence presents a new technique to design test-experiments for intermittent faults which can conveniently be used for relatively more complex synchronous sequential circuits.