Software reliability modeling based on test coverage
Shuanqi Wang, Yumei Wu, Minyan Lu, Haifeng Li · 2011
In order to incorporate the effect of test coverage, two novel software reliability growth models (SRGMs) are proposed in this paper using failure data and test coverage simultaneously. One is continuous using testing time, and the other is discrete with respect to the number of executed test cases instead of testing time. Since one of the most important factors of the coverage-based SRGMs is the test coverage function (TCF), we first discuss a discrete TCF based on Beta function. Then we develop mean value functions (MVF) of the two models integrating test coverage and imperfect debugging. Finally the proposed TCF and MVFs are evaluated and validated on actual software reliability data collected from real software development projects. The results demonstrate clearly that both the proposed TCF and SRGMs provide better estimation and fitting for the data sets under comparisons.