PUF ID generation method for modeling attacks
Yusuke Nozaki, Kensaku Asahi, Masaya Yoshikawa · 2014
Recently, semiconductor counterfeiting has become a serious problem. Physical Unclonable Function (PUF) prevents counterfeiting. It utilizes random characteristic patterns which are difficult to control artificially. PUF can identify genuineness semiconductor, even if all circuit patterns are duplicated. However, the conventional PUF is weak against modeling attacks. This study proposes a PUFID generating method which has tamper resistance. The proposed method uses secret sharing schemes which can eliminate the correlation between PUFID and characteristic patterns of PUF. Simulation results show the validity on the proposed method.