Pentium Pro processor design for test and debug
A. Carbine, D.B.I. Feltham · IEEE Design & Test of Computers · 1998
The need to quickly ramp a complex, high-performance microprocessor into high-volume manufacturing with low defect rates led this design team to a custom, low-area DFT approach and a manually written test methodology that targeted several fault models. Their approach effectively balanced testability needs with other design constraints, while enabling excellent time to market and test quality.