Detecting the Number of EMI Sources Based on Higher Order Statistics
Zhenfei Song, Donglin Su, Xie Shuguo · 2009
A new method for electromagnetic compatibility (EMC) fault diagnosis based on blind source separation (BSS) is proposed in this paper. Higher order statistics (HOS) method is used to detect the number of electromagnetic interference (EMI) sources. Differing from normal analysis, the new method is performed in frequency domain considering the characteristics of EMC problem. Simulation shows better noise immunity of the new method, and the feasibility is verified by using EMI measurement data. This new method provides a new way for EMC fault diagnosis.