Measurement of emitter and collector series resistances
L.J. Giacoletto · IEEE Transactions on Electron Devices · 1972
Emitter and collector series (extrinsic) resistances can be evaluated by measuring the open-circuited (floating) junction voltage as the other junction is forward biased. Evaluation can be carried out on either a point-by-point basis or with the aid of a curve tracer. Specific results are indicated for a 2N4400 transistor and an experimental transistor.