Techniques for testing microprocessor boards
R.G. Bennetts · IEE Proceedings A Physical Science Measurement and Instrumentation Management and Education Reviews · 1981
The purpose of the paper is to review the current status of testing as it relates to printed circuit boards (PCBS) that contain digital LSI and VLSI devices such as a microprocessor. The paper tackles four main subjects: major problems caused by the use of complex devices on PCBSs; techniques for testing specific devices; general-purpose test strategy for PCBs containing complex devices; guidelines and design strategy for testable designs. The paper references 108 other publications available in the open literature.