A connected component labeling algorithm for wheat root thinned image
Shaomin Mu, Zha Xuheng, Haiyang Du, QingBo Hao, TengTeng Chang · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013
Measuring wheat root length need manual measure by measuring rule, waste time and energy, low precision, aiming at this problem in this paper a connected component labeling algorithm for wheat root thinned image is presented. The algorithm realized on the basis of regional growth thought by dynamic queue list, only need one scan can finish label process. Aiming at label of wheat root thinned image, the algorithm compared with three algorithms, the experimental results show that the algorithm effect is good and suited to connecting component labeling for wheat root thinned image.