Design of reusable test platform for microprocessor
Ling Liu, Feng Wennan, Jiang Anping, Wang Yingchun, Ji Lijiu · 2003
In this paper we present a design of a reusable test platform for microprocessors. This platform could automatically adapt to different set of microprocessors under test. It could be configured to various functional test environments as required, and also it integrates a CMDL (code mapping description language) assembler which gains general-purpose assemble capability to enhance the instructional-level retargetability of the platform. Experiments show that the platform works correctly, flexibly and efficiently.