Minimal length diagnostic tests for analog circuits using test history
Alfred V. Gomes, Abhijit Chatterjee · 1999
Article Free Access Share on Minimal length diagnostic tests for analog circuits using test history Authors: Alfred V. Gomes School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GAView Profile , Abhijit Chatterjee School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GAView Profile Authors Info & Claims DATE '99: Proceedings of the conference on Design, automation and test in EuropeJanuary 1999 Pages 41–eshttps://doi.org/10.1145/307418.307488Published:01 January 1999Publication History 5citation73DownloadsMetricsTotal Citations5Total Downloads73Last 12 Months7Last 6 weeks1 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF