Instruction based Built-in-Testing of Instruction Select Multiplexer in Arithmetic Logic Unit
Purevsuren Tsoozol, Josef Börcsök, M Schwarz · Journal of Physics Conference Series · 2012
Due to the complexity of microprocessor, an efficient testing is a crucial point and serious challenge in safety systems. A new instruction opcode for ALU based Built-In-Test (BIT) is proposed in this paper. With this novel method stuck-at-fault in Multiplexer (MUX) for Arithmetic Logic Unit (ALU) can be determined. A model that consists of the command and faulty states is developed. According to the designed state model, an algorithm and pseudo program that tests the stuck-at-fault in MUX is implemented and described in this paper.