Test and Repair Flow for Shared BISR in Asynchronous Multi-processors
Gang Wang, Xu Wang, Xinke Chen, Shuangbai Xue · 2014
We present a hierarchical test and repair flow for shared BISR (Built-In Self-Repair) in asynchronous multi-processors. The flow partitions the memories local to a processor in groups and treats the groups as a whole when doing the repair. The flow runs automatically with few interventions except at the beginning stage. It can be used effectively for practical industrial test and repair. Its test time is as good as equivalent to that of parallel BISR, while its test power is substantially lower, about 40% that of parallel repair. It also has a superior repair rate, about 11-12% better compared to sequential and parallel BISR.