Highly reliable data layout schemes for very large scale storage systems
Dongjian Luo, Haifeng Zhong, Wei Wu · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2009
In this paper, we investigate data layout schemes and their impact on system reliability in a petabyte scale storage system built from thousands of Object-Based Storage Devices. We delve in two underlying data layout schemes: RAID 5 and RAID 5 mirroring. To accelerate data reconstruction, Fast Mirroring Copy is employed where the reconstructed objects are stored on different OBSDs throughout the system. In order to improve the system reliability, SMART Reliability Mechanism (SRM) is introduced for enhancing the reliability in very large-scale storage system. Analysis results show that they can be used to assure the reliability of data storage and efficiently utilize the disk resource while exert minimum impact on the whole systems performance.