MULTES/IS: an effective and reliable test generation system for partial scan and non-scan synchronous circuits
Takuji Ogihara, Katsunobu Muroi, G. Yonemori, Shinichi Murai · 1989
This paper describes an automatic test generation system which effectively generates test vectors by recognizing the circuit blocks for which vectors are automatically generated and the circuit blocks for which vectors have to be manually prepared.