Test Quality Improvement with Timing-aware ATPG: Screening small delay defect case study

C.-J.J. Chang; T. Kobayashi

doi:https://doi.org/10.1109/test.2008.4700702

Test Quality Improvement with Timing-aware ATPG: Screening small delay defect case study

C.-J.J. Chang, T. Kobayashi · 2008

Silicon results from 512 K sample chips tested with Timing-aware ATPG are presented. We had 4040 unique detections from 86 K timing-aware pattern. We will also show ATPG results and estimate the quality impact of timing-aware ATPG.

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