Diagnosis of Local Spot Defects in Analog Circuits
Ke Wang Huang, Haralampos‐G. Stratigopoulos, Salvador Mir, Charanpreet Singh Hora, Yizi Xing, Bram Kruseman · IEEE Transactions on Instrumentation and Measurement · 2012
We present a method for diagnosing local spot defects in analog circuits. The method aims to identify a subset of defects that are likely to have occurred and suggests to give them priority in a classical failure analysis. For this purpose, the method relies on a combination of multiclass classifiers that are trained using data from fault simulation. The method is demonstrated on an industrial large-scale case study. The device under consideration is a controller area network transceiver used in automobile systems. This device demands high-quality control due to the reliability requirements of the application wherein it is deployed. The diagnosis problem is discussed by taking into consideration the realities of this case study.