Enhanced double-histogram test
María Ángeles Jalón, Adoracion Rueda, E. Peralías · Electronics Letters · 2009
A method is introduced for reducing experimental setup complexity and time costs associated with the A/D converters linearity test using double histograms. The method is independent of the waveform of the test signal and it does not require inclusion of any time-interleaved technique to reduce time-drift effects.