An Automatic Test Set for the Dynamic Characterization of A/D Converters
Tina M. Souders, Donald R. Flach, Thick C. Wong · IEEE Transactions on Instrumentation and Measurement · 1983
An automatic test set is described for measuring the dynamic characteristics of A/D converters having up to 16 bits of resolution. The test converter is exercised with stepped input changes typical of the conditions of actual use. All dynamic test parameters are under program control, making it possible to separate and measure dynamic errors of various sources. Typical test results are included.