Pairwise Test Case Generation Based on Module Dependency
Jeongchang Kim, Kyoung-Ho Choi, G. JUNG · IEICE Transactions on Information and Systems · 2006
This letter proposes a modified Pairwise test case generation algorithm. The proposed algorithm produces additional test cases that may not be covered by Pairwise algorithm due to the dependency between internal modules of software systems. The algorithm produces additional cases utilizing internal module dependencies. The algorithm effectively increases the coverage of testing without significantly increasing the number of test cases.