C-element multiplexing for fault-tolerant logic circuits
Chris Winstead · Electronics Letters · 2009
A novel approach to von Neumann multiplexing is considered, in which NAND gates are replaced by Muller C-elements. The new method is developed as an application of maximum a-posteriori (MAP) estimation, and is shown to be superior to NAND multiplexing in systems where transient upsets are the dominant fault species.