Testing of micrologic elements
Robert H. Norman, Richard C. Anderson · 1961
The acceptance tests of integrated logic-function elements require a departure from the notion that the parameters of the individual components of a circuit must be known. A test program based on external characteristics only is made necessary by the complexity of the circuit; it is contended, in addition, that such a test has more valid significance than does measurement of constituent parameters. It is more significant, for example, when testing a compatible set of digital functional blocks, to make a measurement which gives a direct estimate of fan-out than it is to measure the gains, leakage currents, and resistor values in the output stages.This paper will discuss the validity of this concept and describe a program of tests based on the concept.