A strongly code disjoint built-in current sensor for strongly fault-secure static CMOS realizations
Jien-Chung Lo, James C. Daly, M. Nicolaidis · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1995
We present a strongly code disjoint (SCD) built-in current sensor (BICS) based on self-exercising concept. The integration of this SCD BICS with a self-checking circuit achieves the totally self-checking goal in static CMOS realizations, even in the presence of stuck-on and bridging faults, and results in a strongly fault-secure realization. Low-cost and high fault coverage is attractive for many high reliability and critical applications.>