A Comparison of DC and Transient Response Tests for Analogue Circuits
DAVID J. TAYLOR, P.S.A. Evans, T.I. Pritchard · 1992
Transient Response Analysis [1] (TRA) is a quick and inexpensive method of testing analogue circuitry. In this paper we compare the effectiveness of traditional DC testing of analogue circuit cells with dynamic tests, using a simple analogue subcircuit element which models one component of a large mixed-signal ASIC.